20 Oct 2008
Seminar on "Advanced On-Chip Electrostatic Discharge (ESD) Protection Solutions for Digital, Analog, and RF Integrated Circuits"

A seminar titled 'Advanced On-Chip Electrostatic Discharge (ESD) Protection Solutions for Digital, Analog, and RF Integrated Circuits', organized by the department of Electrical and Electronics Engineering of faculty of Science and Technology, took place at Analog and Mixed-Signal VLSO Laboratory in UM on 14th October 2008 with the support from the IEEE Macau CAS/COM Joint-Chapter and Chipidea MIPS Technologies Analog Business Group.

The seminar is delivered by Prof. Juin J. Liou, Analog Devices Professor from School of EE and CS, University of Central Florida (USA). He received his B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida, Orlando, Florida where he is now Analog Devices Professor. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design and simulation. Dr. Liou has been awarded 3 U.S. patents (3 more filed and pending), and has published 8 books, more than 220 journal papers (including 14 invited articles), and more than 170 papers (including 60 keynote or invited papers) in international and national conference proceedings.

During the seminar, Prof. Liou has mentioned about the Electrostatic discharge (ESD) as a process in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event. As such, designing robust on-chip ESD structures to protect microchips against the ESD stress is a high priority in the semiconductor industry. Besides, Prof. Liou has also provided an overview on the ESD sources, models, protection schemes, and testing has been given and was followed by the examples of robust ESD solution designs for protecting various integrated circuits for digital, analog, power, and RF applications.